The GRD-CS3 ultrasonic scanning microscope is a highly practical non-destructive testing tool. This product primarily utilizes high-frequency ultrasound to inspect various semiconductor devices and materials, detecting internal defects such as pores, cracks, inclusions, and delamination, and displaying them graphically. The scanning process does not damage the sample or affect its performance. Therefore, it is widely used in semiconductor device and packaging inspection, materials inspection, and IGBT power module product inspection.
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