Probe high-frequency probe

Product Description

Application areas: Automotive electronics, semiconductor wafers, consumer electronics, communication connectivity, etc.
Probe Models: The focus is on the L2 probe model, whose main features are miniaturization and high density.
Minimum probe outer diameter: 0.13mm (corresponding to a spacing of 0.18mm)
Minimum probe length: 2.0mm
Supported pitch range: Covering various fine pitch requirements from 0.18mm to 0.80mm.
Probe characteristics:
Low elasticity: This results in less pressure on the object being tested, minimizing damage.
Low resistance: Ensures the accuracy and efficiency of signal transmission.
Fast and stable current transfer: meets high-frequency testing requirements.
Advanced Technology: The use of Fine Barrel and gold plating is key to achieving high performance.
Probe test report: Compared with competing products at room temperature, the results show significant advantages:
Resistance: After multiple cycles of testing, the probe's resistance value is lower than or comparable to that of competing products, demonstrating excellent conductivity stability.
Elasticity: The elasticity is significantly lower than that of competitors (average elasticity of 106.4gf after 100K cycles, compared to 121.5gf for competitors), meaning it experiences less impact on the test points and is safer.