The Die Test device is a highly efficient, automated system specifically designed for optical and electrical testing of microdisplay chips in their cell state. Primarily targeting small-sized products ranging from 0.2 to 2 inches, it can complete rapid testing within a 7-second cycle time.
Its core feature is its support for independent parallel testing of four channels; an anomaly in one channel does not affect the others, significantly improving testing efficiency and stability. The equipment uses long-life Blade probe fixtures to ensure excellent contact reliability and test success rate. Simultaneously, the equipment possesses comprehensive intelligent production data management capabilities, automatically collecting and storing test data, generating reports, and uploading them to the server, providing strong support for process analysis and quality traceability.
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